Optical Inspection & Measurement instruments
Nondestructive Testing solution
Optical Inspection & Measurement instruments
Multifunctional Static/Dynamic 3D Surface Profiler SP-MWI
SP-MWI combines a variety of sophisticated optical measurement techniques, suitable for semiconductor, MEMS/biochemical structure detection and analysis; 2D and 3D static measurements of object surface, dynamic measurements of natural resonance frequencies for the microstructure, inside/outside surface vibration modal test; combined FTIR technology to obtain whole field hyperspectral data, which can be employed for analyzing color, texture, composition, etc.
Portable stress tester
This product can detect and analyze internal object stress distribution. The stress tester is a portable measurement device for structural design, which makes detection of stress is no longer confined to laboratory environment but can be directly performed in measurement fields. With 1000mm detecting FOV, the system can provide more intuitive stress distribution results.
Miniaturized spectrometer/ Hyperspectral Imaging System
The company offers a total choice of services and measurement tools for spectral analysis with spectral range from UV to NIR, and measurement methods of single-point, multi-point, line scanning and area-based spectral measurements. The company also offers powerful software for spectral comparison and analysis, biochemical analysis, as well as provides all the spectral measurement services.
SP-SWI/SP-DWI Optical Static/Dynamic surface Profiler
Fast nano-scale 3D profiling measurement, resonant frequency detecting
Surface analysis：roughness, flatness, thickness, step-height
- Fast static profiling
SP-DWI/SWI provides friendly user interface, non-contact, fast and nano-scale precision 3D profiling measurement. It is suitable for analyzing any material surface with at least 1% reflectivity. The roughness and the step height analysis can be implemented.
- Dynamic measurement
With high frequency stroboscopy (>1MHz), SP-DWI can measure the dynamic characteristics of the MEMS, such as the vibration mode and the surface profile of the periodic vibrating motion.
